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DATE
2010
IEEE
161views Hardware» more  DATE 2010»
14 years 4 months ago
Aging-resilient design of pipelined architectures using novel detection and correction circuits
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
Hamed F. Dadgour, Kaustav Banerjee
ASPDAC
2009
ACM
117views Hardware» more  ASPDAC 2009»
14 years 6 months ago
Adaptive techniques for overcoming performance degradation due to aging in digital circuits
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...