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ATS
1996
IEEE
93views Hardware» more  ATS 1996»
14 years 3 months ago
Testable Design and Testing of MCMs Based on Multifrequency Scan
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
Wang-Dauh Tseng, Kuochen Wang
DATE
2003
IEEE
90views Hardware» more  DATE 2003»
14 years 4 months ago
Extending JTAG for Testing Signal Integrity in SoCs
As the technology is shrinking and the working frequency is going into multi gigahertz range, the issues related to interconnect testing are becoming more dominant. Specifically,...
Nisar Ahmed, Mohammad H. Tehranipour, Mehrdad Nour...