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PATMOS
2007
Springer
14 years 5 months ago
Exploiting Input Variations for Energy Reduction
The deep submicron semiconductor technologies will make the worst-case design impossible, since they can not provide design margins that it requires. Research directions should go ...
Toshinori Sato, Yuji Kunitake
ISQED
2007
IEEE
197views Hardware» more  ISQED 2007»
14 years 5 months ago
A Simple Flip-Flop Circuit for Typical-Case Designs for DFM
The deep submicron (DSM) semiconductor technologies will make the worst-case design impossible, since they can not provide design margins that it requires. Research directions sho...
Toshinori Sato, Yuji Kunitake