DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
In this work, we experiment with complier-directed instruction duplication to detect soft errors in VLIW datapaths . In the proposed approach, the compiler determines the instruct...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
A CMOS harmonic signal LC oscillator driver for automotive applications working in a harsh environment with high safety critical requirements is described. The driver can be used ...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
This paper retraces the historical development of wireless LAN technology in the context of the pursuit of ever higher data rate, describes the significant technical breakthroughs...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
The idea of design domain specific Mother Model of IP block family as a base of modeling of system integration is presented here. A common reconfigurable Mother Model for ten diff...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper we present a new technique which exploits timing-correlation between tasks for scheduling analysis in multiprocessor and distributed systems with tree-shaped task-de...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
Increasing functional and non-functional requirements in automotive electric /electronic vehicle development will significantly enhance the integration of novel functions in the e...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
This paper presents the methodology and the modeling constructs we have developed to capture the real time aspects of RTOS simulation models in a System Level Design Language (SLD...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper, two packing algorithms for the detection of activity profiles in MTCMOS-based FPGA structures are proposed for leakage power mitigation. The first algorithm is a ...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...