DFT
2009
IEEE
14 years 2 months ago
2009
IEEE
Optimizing the BIST configuration based on the characteristics of the design under test is a complicated and challenging work for test engineers. Since this problem has multiple o...
DFT
2009
IEEE
14 years 2 months ago
2009
IEEE
We present an error detection technique for a floating point adder which uses a checker adder of reduced precision to determine if the result is correct within some error bound. O...
DFT
2009
IEEE
14 years 6 months ago
2009
IEEE
Recently, a new test point insertion method for pseudo-random built-in self-test (BIST) was proposed in [Yang 09] which tries to use functional flip-flops to drive control test po...
DFT
2009
IEEE
14 years 6 months ago
2009
IEEE
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...
DFT
2009
IEEE
14 years 6 months ago
2009
IEEE
Hybrid CMOS/non-CMOS memories, in short hybrid memories, have been lauded as future ultra-capacity data memories. Nonetheless, such memories are going to suffer from high degree o...
DFT
2009
IEEE
14 years 6 months ago
2009
IEEE
We propose a framework that allows dual-layer cooperative error control in a nanoscale network-on-chip (NoC), to simultaneously improve reliability, performance and energy efficie...
DFT
2009
IEEE
14 years 6 months ago
2009
IEEE
The temperature dependence of MOSFET drain current varies with supply voltage. Two distinct voltage regions exist—a normal dependence (ND) region where an increase in temperatur...
DFT
2009
IEEE
14 years 6 months ago
2009
IEEE
This paper presents a study of errors that occur in DNA self-assembly using synthesized tile sets for template manufacturing. It is shown that due to the reduced size, aggregates ...
DFT
2009
IEEE
14 years 6 months ago
2009
IEEE
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...