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Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularly address the problem of diagnosing faults that exhibit the so-called Byzantine...
We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael ...
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, We...