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TCAD
2010
105views more  TCAD 2010»
13 years 6 months ago
Fault Tolerant Network on Chip Switching With Graceful Performance Degradation
The structural redundancy inherent to on-chip interconnection networks [networks on chip (NoC)] can be exploited by adaptive routing algorithms in order to provide connectivity eve...
Adán Kohler, Gert Schley, Martin Radetzki
DATE
2000
IEEE
121views Hardware» more  DATE 2000»
14 years 3 months ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
14 years 5 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt