DAGSTUHL
2006
13 years 8 months ago
2006
We present a major revision of the XPath benchmark known as XPathMark [1]. The new version splits into a functional test over a small educational document and a more elaborated per...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
GLVLSI
2005
IEEE
14 years 1 months ago
2005
IEEE
We develop a neural network that learns to separate the nominal from the faulty instances of a circuit in a measurement space. We demonstrate that the required separation boundari...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
In the past, test data volume reduction techniques have concentrated heavily on scan test data content. However, functional vectors continue to be utilized because they target uni...
GLVLSI
2007
IEEE
14 years 1 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...