ISCA
2012
IEEE
12 years 4 months ago
2012
IEEE
The reliability of future processors is threatened by decreasing transistor robustness. Current architectures focus on delivering high performance at low cost; lifetime device rel...
ASPLOS
2012
ACM
12 years 9 months ago
2012
ACM
Future microprocessors need low-cost solutions for reliable operation in the presence of failure-prone devices. A promising approach is to detect hardware faults by deploying low-...
DAC
2011
ACM
13 years 1 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
ISCA
2000
IEEE
14 years 6 months ago
2000
IEEE
Smaller feature sizes, reduced voltage levels, higher transistor counts, and reduced noise margins make future generations of microprocessors increasingly prone to transient hardw...
GI
2003
Springer
14 years 7 months ago
2003
Springer
: The Byzantine failure model allows arbitrary behavior of a certain fraction of network nodes in a distributed system. It was introduced to model and analyze the effects of very s...
SAC
2005
ACM
14 years 7 months ago
2005
ACM
This paper describes the use of fault tolerance in a multiagent system. Such an approach is based on the modeling of autonomous agents with planning capabilities. These capabiliti...
MICRO
2009
IEEE
14 years 8 months ago
2009
IEEE
Continued technology scaling is resulting in systems with billions of devices. Unfortunately, these devices are prone to failures from various sources, resulting in even commodity...