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ICCAD
2010
IEEE
145views Hardware» more  ICCAD 2010»
13 years 4 months ago
Fuzzy control for enforcing energy efficiency in high-performance 3D systems
3D stacked circuits reduce communication delay in multicore system-on-chips (SoCs) and enable heterogeneous integration of cores, memories, sensors, and RF devices. However, vertic...
Mohamed M. Sabry, Ayse Kivilcim Coskun, David Atie...
ICCAD
2010
IEEE
109views Hardware» more  ICCAD 2010»
13 years 4 months ago
Misleading energy and performance claims in sub/near threshold digital systems
Abstract-- Many of us in the field of ultra-low-Vdd processors experience difficulty in assessing the sub/near threshold circuit techniques proposed by earlier papers. This paper i...
Yu Pu, Xin Zhang, Jim Huang, Atsushi Muramatsu, Ma...
ICCAD
2010
IEEE
119views Hardware» more  ICCAD 2010»
13 years 4 months ago
Symbolic system level reliability analysis
Abstract--More and more embedded systems provide a multitude of services, implemented by a large number of networked hardware components. In early design phases, dimensioning such ...
Michael Glaß, Martin Lukasiewycz, Felix Reim...
ICCAD
2010
IEEE
158views Hardware» more  ICCAD 2010»
13 years 4 months ago
Novel binary linear programming for high performance clock mesh synthesis
Clock mesh is popular in high performance VLSI design because it is more robust against variations than clock tree at a cost of higher power consumption. In this paper, we propose ...
Minsik Cho, David Z. Pan, Ruchir Puri
ICCAD
2010
IEEE
186views Hardware» more  ICCAD 2010»
13 years 4 months ago
Efficient state space exploration: Interleaving stateless and state-based model checking
State-based model checking methods comprise computing and storing reachable states, while stateless model checking methods directly reason about reachable paths using decision proc...
Malay K. Ganai, Chao Wang, Weihong Li
ICCAD
2010
IEEE
186views Hardware» more  ICCAD 2010»
13 years 4 months ago
Application-Aware diagnosis of runtime hardware faults
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
Andrea Pellegrini, Valeria Bertacco
ICCAD
2010
IEEE
96views Hardware» more  ICCAD 2010»
13 years 4 months ago
Design of large area electronics with organic transistors
Makoto Takamiya, Koichi Ishida, Tsuyoshi Sekitani,...
ICCAD
2010
IEEE
125views Hardware» more  ICCAD 2010»
13 years 4 months ago
Peak current reduction by simultaneous state replication and re-encoding
Reducing circuit's peak current plays an important role in circuit reliability in deep sub-micron era. For sequential circuits, it is observed that the peak current has a str...
Junjun Gu, Gang Qu, Lin Yuan, Qiang Zhou
ICCAD
2010
IEEE
156views Hardware» more  ICCAD 2010»
13 years 4 months ago
Boolean matching of function vectors with strengthened learning
Boolean matching for multiple-output functions determines whether two given (in)completely-specified function vectors can be identical to each other under permutation and/or negat...
Chih-Fan Lai, Jie-Hong R. Jiang, Kuo-Hua Wang
FPL
2010
Springer
139views Hardware» more  FPL 2010»
13 years 4 months ago
Mapping Multiple Multivariate Gaussian Random Number Generators on an FPGA
A Multivariate Gaussian random number generator (MVGRNG) is an essential block for many hardware designs, including Monte Carlo simulations. These simulations are usually used in a...
Chalermpol Saiprasert, Christos-Savvas Bouganis, G...