ISQED
2006
IEEE
14 years 6 months ago
2006
IEEE
— A methodology is proposed for interdependent setup time and hold time characterization of sequential circuits. Integrating the methodology into an industrial sign-off static ti...
ISQED
2010
IEEE
14 years 7 months ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...