ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
—It is an important issue to reduce the power consumption of a hard disk that takes a large amount of computer system’s power. As a new trend, an NV cache is used to make a dis...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
—In this paper we examine techniques for increasing the effective bandwidth of the microprocessor offchip interconnect. We focus on mechanisms that are orthogonal to other techni...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
Abstract— Over the last decade, the design of ultra-lowpower digital circuits in subthreshold regime has been driven by the quest for minimum energy per operation. In this contri...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
— Heterogeneous Chip Multiprocessors (HMPs), such as the Cell Broadband Engine, offer a new design optimization opportunity by allowing designers to provide accelerators for appl...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
—This paper addresses the problem of chip level thermal profile estimation using runtime temperature sensor readings. We address the challenges of a) availability of only a few t...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
— Clock frequency and transistor density increases have resulted in elevated chip temperatures. In order to meet temperature constraints while still exploiting the performance op...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
High associativity is important for level-two cache designs [9]. Implementing CAM-based Highly Associative Caches (CAM-HAC), however, is both costly in hardware and exhibits poor s...
ICCD
2008
IEEE
14 years 9 months ago
2008
IEEE
- A gate level probabilistic error propagation model is presented which takes as input the Boolean function of the gate, the signal and error probabilities of the gate inputs, and ...