IOLTS
2006
IEEE
14 years 6 months ago
2006
IEEE
A significant fraction of soft errors in modern microprocessors has been reported to never lead to a system failure. Any concurrent error detection scheme that raises alarm every ...
IOLTS
2006
IEEE
14 years 6 months ago
2006
IEEE
This paper describes a highly reliable digital circuit design method based on totally self checking blocks implemented in FPGAs. The bases of the self checking blocks are parity p...
IOLTS
2006
IEEE
14 years 6 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
IOLTS
2006
IEEE
14 years 6 months ago
2006
IEEE
FPGA emulation has proven to be a performance effective method to analyse the behaviour of digital circuits in the presence of soft errors due to SEU effects. In particular, the r...
IOLTS
2006
IEEE
14 years 6 months ago
2006
IEEE
Recently, various attacks have been proposed against many cryptosystems, exploiting deliberate error injection during the computation process. In this paper, we add a residue-base...
IOLTS
2006
IEEE
14 years 6 months ago
2006
IEEE
This work presents a fault-tolerant version of the
IOLTS
2006
IEEE
14 years 6 months ago
2006
IEEE
This work intends to evaluate the effect of a Single Event Upsets (SEUs) and crosstalk faults in a NoC router architecture by developing a fault injection mechanism, allowing an a...
IOLTS
2006
IEEE
14 years 6 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
IOLTS
2006
IEEE
14 years 6 months ago
2006
IEEE
The early propagation effect found in many logic gates is a potential source of data-dependent power consumption. We show that the effect and the corresponding power dependency ca...