In this paper, we propose ColorSafe, an architecture that detects and dynamically avoids single- and multi-variable atomicity violation bugs. The key idea is to group related data...
Numerous studies have shown that datacenter computers rarely operate at full utilization, leading to a number of proposals for creating servers that are energy proportional with r...
Dennis Abts, Michael R. Marty, Philip M. Wells, Pe...
Aggressive technology scaling into the nanometer regime has led to a host of reliability challenges in the last several years. Unlike onchip caches, which can be efficiently prot...
Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott ...
DRAM vendors have traditionally optimized the cost-perbit metric, often making design decisions that incur energy penalties. A prime example is the overfetch feature in DRAM, wher...
Aniruddha N. Udipi, Naveen Muralimanohar, Niladris...
As CMOS scales beyond the 45nm technology node, leakage concerns are starting to limit microprocessor performance growth. To keep dynamic power constant across process generations...
As technology scales ever further, device unreliability is creating excessive complexity for hardware to maintain the illusion of perfect operation. In this paper, we consider whe...
Marc de Kruijf, Shuou Nomura, Karthikeyan Sankaral...
Light-weight, flexible access control, which allows software to regulate reads and writes to any granularity of memory region, can help improve the reliability of today’s multi...
Continued device scaling enables microprocessors and other systems-on-chip (SoCs) to increase their performance, functionality, and hence, complexity. Simultaneously, relentless s...