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    ISQED
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    IEEE
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    Simultaneous test pattern compaction, ordering and X-filling for testing power reduction

    14 years 7 months ago
    Simultaneous test pattern compaction, ordering and X-filling for testing power reduction
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    Ju-Yueh Lee, Yu Hu, Rupak Majumdar, Lei He
    claim paper
    Added 19 May 2010
    Updated 19 May 2010
    Type Conference
    Year 2009
    Where ISQED
    Authors Ju-Yueh Lee, Yu Hu, Rupak Majumdar, Lei He
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