ISQED
2010
IEEE
14 years 7 months ago
2010
IEEE
Abstract— As the semiconductor technology continues its marching toward the deep sub-micron domain, the strong relation between leakage current and temperature becomes critical i...
ISQED
2010
IEEE
14 years 7 months ago
2010
IEEE
ISQED
2010
IEEE
14 years 7 months ago
2010
IEEE
—Negative Bias Temperature Instability (NBTI) is one of the major reliability problems in advanced technologies. NBTI causes threshold voltage degradation in a PMOS transistor wh...
ISQED
2010
IEEE
14 years 7 months ago
2010
IEEE
Leakage power has grown significantly and is a major challenge in SoC design. Among SoC's components, clock distribution network power accounts for a large portion of chip po...