ICCD
2006
IEEE
14 years 11 months ago
2006
IEEE
— As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the vol...
ICCD
2007
IEEE
14 years 11 months ago
2007
IEEE
On-chip caches take a large portion of the chip area. They are much more vulnerable to parameter variation than smaller units. As leakage current becomes a significant component ...