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ICCAD
2004
IEEE
97views Hardware» more  ICCAD 2004»
14 years 8 months ago
Statistical design and optimization of SRAM cell for yield enhancement
In this paper, we have analyzed ond modeled the fiilure probabilities ofSRAM cells due to process parameter variations. A method to predict the yield of a memoiy chip based on the...
Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaush...
DAC
2008
ACM
15 years 17 days ago
Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array fo
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...