—Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not ...
A. J. van de Goor, Georgi Gaydadjiev, Said Hamdiou...
: Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characteri...
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev...