As technology feature size is reduced, ESD becomes the dominant failure mode due to lower gate oxide breakdown voltage. In this paper, the effectiveness of new gate and substrate ...
Oleg Semenov, H. Sarbishaei, Valery Axelrad, Manoj...
A novel method (the V-shaped curve) is presented to predict the failure probability of anisotropic conductive film (ACF) in IC/substrate assemblies. The Poisson function is used t...
This paper demonstrates a keyword match processor capable of performing fast dictionary search with approximate match capability. Using a content addressable memory with processor...
Organic Thin Film Transistors are a new class of sensors potentially capable of outperforming chemiresistors. They can be operated at room temperature, offer the advantage of rema...
Maria C. Tanese, Daniel Fine, Ananth Dodabalapur, ...
A new hybrid approach consists to use the advantages of both systems namely the high geometric aspects of the electrodes of the ultracapacitor and the high dielectric strength of ...
A. Albina, P. L. Taberna, J. P. Cambronne, P. Simo...
The Hardware (HW)/Software (SW) partitioning/scheduling relies on two subtasks : the cost function and the real time (RT) analysis. Besides these two subtasks, the proposed generi...
A CMOS voltage reference, based on the difference between the gate-source voltages of two NMOS transistors, has been realized with AMS 0.35 m CMOS technology (Vthn=0.45 V and Vthn=...
The role of CMOS Image Sensors since their birth around the 1960s, has been changing a lot. Unlike the past, current CMOS Image Sensors are becoming competitive with regard to Cha...
M. Bigas, Enric Cabruja, Josep Forest, Joaquim Sal...