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GLVLSI
2009
IEEE
112views VLSI» more  GLVLSI 2009»
14 years 7 months ago
The effect of design parameters on single-event upset sensitivity of MOS current mode logic
In this paper, we describe and discuss the effects of design parameters such as transistor size, output voltage swing and bias current on radiation sensitivity of MOS current mode...
Mahta Haghi, Jeff Draper
ISQED
2009
IEEE
91views Hardware» more  ISQED 2009»
14 years 7 months ago
Variability-aware optimization of nano-CMOS Active Pixel Sensors using design and analysis of Monte Carlo experiments
We propose a novel design flow for mismatch and processvariation aware optimization of nanoscale CMOS Active Pixel Sensor (APS) arrays. As a case study, an 8 × 8 APS array is de...
Dhruva Ghai, Saraju P. Mohanty, Elias Kougianos