GLVLSI
2010
IEEE
14 years 18 days ago
2010
IEEE
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible to wear-out related permanent faults and transient faults, necessitating on-chi...
ASPLOS
2006
ACM
14 years 4 months ago
2006
ACM
Transient faults are expected a be a major design consideration in future microprocessors. Recent proposals for transient fault detection in processor cores have revolved around t...
HOTOS
2007
IEEE
14 years 4 months ago
2007
IEEE
Given that the majority of future processors will contain an abundance of execution cores, redundant execution can offer a promising method for increasing the availability and res...
APCSAC
2005
IEEE
14 years 6 months ago
2005
IEEE
Increasing microprocessor vulnerability to soft errors induced by neutron and alpha particle strikes prevents aggressive scaling and integration of transistors in future technologi...
HPCA
2008
IEEE
15 years 24 days ago
2008
IEEE
The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can p...
ASPLOS
2009
ACM
15 years 1 months ago
2009
ACM
Even though graphics processors (GPUs) are becoming increasingly popular for general purpose computing, current (and likely near future) generations of GPUs do not provide hardwar...