MAM
2002
14 years 7 months ago
2002
This paper presents the implementation of a Linux-based experimental boundary scan environment. Its primary aim is to provide a
DELTA
2004
IEEE
14 years 11 months ago
2004
IEEE
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
DFT
2000
IEEE
14 years 11 months ago
2000
IEEE
Because domino logic design offers smaller area and higher speed than complementary CMOS design, it has been very popularly used to design highperformance processors. However: dom...
ITC
2003
IEEE
15 years 18 days ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...