Sciweavers
Explore
Publications
Books
Software
Tutorials
Presentations
Lectures Notes
Datasets
Labs
Conferences
Community
Upcoming
Conferences
Top Ranked Papers
Most Viewed Conferences
Conferences by Acronym
Conferences by Subject
Conferences by Year
Tools
Sci2ools
International Keyboard
Graphical Social Symbols
CSS3 Style Generator
OCR
Web Page to Image
Web Page to PDF
Merge PDF
Split PDF
Latex Equation Editor
Extract Images from PDF
Convert JPEG to PS
Convert Latex to Word
Convert Word to PDF
Image Converter
PDF Converter
Community
Sciweavers
About
Terms of Use
Privacy Policy
Cookies
32
click to vote
DATE
2000
IEEE
105
views
Hardware
»
more
DATE 2000
»
Yield Improvement and Repair Trade-Off for Large Embedded Memories
14 years 4 months ago
Download
www.date-conference.com
In this paper, we give an overview of the trade-off to improve yield and optimize silicon manufacturing cost. The specific technology focus is on large embedded memories in comple...
Yervant Zorian
claim paper
Read More »