Abstract—We examine the implications of a new hazard-free combinational logic synthesis method [1], which generates multiplexor-based networks from binary decision diagrams (BDDs...
Kenneth Y. Yun, Bill Lin, David L. Dill, Srinivas ...
— Conventional methods for optimal sizing of wires and transistors use linear resistor-capacitor (RC) circuit models and the Elmore delay as a measure of signal delay. If the RC ...
Lieven Vandenberghe, Stephen P. Boyd, Abbas A. El ...
None of the available minimizers for 2-level hazard-free logic minimization can synthesize very large circuits. This limitation has forced researchers to resort to manual and auto...
This paper presents techniques for generating addresses for memories containing multiple arrays. Because these techniques rely on the inversion or rearrangement of address bits, t...
— We introduce a transformation, named rephasing, that manipulates the timing parameters in control-data-flow graphs (CDFG’s) during the high-level synthesis of data-pathinten...
Most existing tools for the synthesisof asynchronouscircuits from Signal Transition Graphs (STGs) derive the reachability graph for the calculation of logic equations. This paper ...
Enric Pastor, Jordi Cortadella, Alex Kondratyev, O...
— Integrated circuits have evolved to a stage where interconnections significantly limit their performance and functional complexity. We introduce a set of tools to perform high...
Rui Martins, Wolfgang Pyka, Rainer Sabelka, Siegfr...
—This paper addresses, from a probabilistic point of view, the issue of switching activity estimation in combinational circuits under the zero-delay model. As the main theoretica...
Conventional scan design imposes considerable area and delay overhead by using larger scan
ip-
ops and additional scan wires without utilizing the functionality of the combinatio...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Mike Ti...
—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...