DSD
2005
IEEE
14 years 6 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
VLSID
2002
IEEE
15 years 25 days ago
2002
IEEE
This paper considers reducing the cost of test application by permuting test vectors to improve their defect coverage. Algorithms for test reordering are developed with the goal o...