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ICCAD
2002
IEEE
85views Hardware» more  ICCAD 2002»
14 years 4 months ago
On undetectable faults in partial scan circuits
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...
Irith Pomeranz, Sudhakar M. Reddy
ASPDAC
2006
ACM
119views Hardware» more  ASPDAC 2006»
14 years 5 months ago
A dynamic test compaction procedure for high-quality path delay testing
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, T...
DATE
2006
IEEE
108views Hardware» more  DATE 2006»
14 years 5 months ago
Test compaction for transition faults under transparent-scan
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...
Irith Pomeranz, Sudhakar M. Reddy