Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola N...
Usual techniques for automatic test data generation are based on the assumption that a complete oracle will be available during the testing process. However, there are programs fo...
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Abstract. Discriminative and generative methods provide two distinct approaches to machine learning classification. One advantage of generative approaches is that they naturally mo...
The application of Evolutionary Algorithms to structural test data generation, known as Evolutionary Testing, has to date largely focused on programs with input-output behavior. H...
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...
In this paper we consider the problem of automatically generating test suites associated with web-based enterprise systems. In particular, we discuss the construction of a tool de...
Arturo Sanchez, Brandon Vega, Alexander Gonzalez, ...
This paper describes a prototype tool, called SimC, which automatically generates test data for unit testing of C programs. The tool symbolically simulates the execution of the gi...
We developed a novel multipoint measurement system capable of acquiring video and sound at more than 100 points in a "synchronized" manner. In this paper, we first descr...