ISNN
2005
Springer
14 years 5 months ago
2005
Springer
This paper presents two non-parametric statistical test methods, called Kolmogorov-Smirnov (KS) and U statistic test methods, respectively, for informative gene selection of a tumo...
VLSID
2004
IEEE
14 years 12 months ago
2004
IEEE
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. C...