DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of Ndetect test do not necessarily exploit the localized characte...
ICCAD
2001
IEEE
14 years 4 months ago
2001
IEEE
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
KDD
2002
ACM
14 years 7 months ago
2002
ACM
This paper promotes the use of supervised machine learning in laboratory settings where chemists have a large number of samples to test for some property, and are interested in id...