ICTAI
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper, a combinatorial auction problem is modeled as a NP-complete set packing problem and a Lagrangian relaxation based heuristic algorithm is proposed. Extensive experim...
DATE
2005
IEEE
14 years 5 months ago
2005
IEEE
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...
DFT
2006
IEEE
14 years 5 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
CRV
2006
IEEE
14 years 5 months ago
2006
IEEE
Evaluation of object detection systems requires a set of test images with objects in heterogeneous scenes. Unfortunately, existing publicly available object databases provide few,...
SEMWEB
2007
Springer
14 years 5 months ago
2007
Springer
Abstract. Ontology matching consists of finding correspondences between ontology entities. OAEI campaigns aim at comparing ontology matching systems on precisely defined test set...
GI
2007
Springer
14 years 5 months ago
2007
Springer
: In addition to the growing complexity of software systems, test effort takes increasing amounts of time and correspondingly more money. Testing costs may be reduced without compr...
CLEAR
2007
Springer
14 years 5 months ago
2007
Springer
We present the design and results of the Spring 2007 (RT-07) Rich Transcription Meeting Recognition Evaluation; the fifth in a series of community-wide evaluations of language tech...
DSD
2009
IEEE
14 years 6 months ago
2009
IEEE
—Long test application time and high temperature have become two major issues of system-on-chip (SoC) test. In order to minimize test application times and avoid overheating duri...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...