DATE
1997
IEEE
13 years 11 months ago
1997
IEEE
A (partial) Built-In Self-Test (BIST) methodology is proposed for analog to digital (MD)converters. In this methodology the number of bits of the A/Dconverter that needs to be mon...
VLSID
2000
IEEE
13 years 11 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
DATE
2002
IEEE
13 years 11 months ago
2002
IEEE
Production test costs for today’s RF circuits are rapidly escalating. Two factors are responsible for this cost escalation: (a) the high cost of RF ATEs and (b) long test times ...