DATE
1997
IEEE
14 years 5 months ago
1997
IEEE
A (partial) Built-In Self-Test (BIST) methodology is proposed for analog to digital (MD)converters. In this methodology the number of bits of the A/Dconverter that needs to be mon...
VLSID
2000
IEEE
14 years 5 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
DATE
2002
IEEE
14 years 5 months ago
2002
IEEE
Production test costs for today’s RF circuits are rapidly escalating. Two factors are responsible for this cost escalation: (a) the high cost of RF ATEs and (b) long test times ...