DAC
2005
ACM
14 years 2 months ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
ISLPED
2005
ACM
14 years 5 months ago
2005
ACM
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...