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    ICCAD
    2005
    IEEE
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    FPGA device and architecture evaluation considering process variations
    14 years 8 months ago
    FPGA device and architecture evaluation considering process variations
    Download  eda.ee.ucla.edu
    Process variations in nanometer technologies are becoming an important issue for cutting-edge FPGAs with a multimillion gate capacity. Considering both die-to-die and withindie va...
    Ho-Yan Wong, Lerong Cheng, Yan Lin, Lei He
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