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ICCAD
2005
IEEE
106views Hardware» more  ICCAD 2005»
14 years 11 months ago
FPGA device and architecture evaluation considering process variations
Process variations in nanometer technologies are becoming an important issue for cutting-edge FPGAs with a multimillion gate capacity. Considering both die-to-die and withindie va...
Ho-Yan Wong, Lerong Cheng, Yan Lin, Lei He