Future microprocessors need low-cost solutions for reliable operation in the presence of failure-prone devices. A promising approach is to detect hardware faults by deploying low-...
Siva Kumar Sastry Hari, Sarita V. Adve, Helia Naei...
Abstract. An important step in achieving robustness to run-time faults is the ability to detect and repair problems when they arise in a running system. Effective fault detection a...
Paulo Casanova, Bradley R. Schmerl, David Garlan, ...
Reliability is a major requirement for most safety-related systems. To meet this requirement, fault-tolerant techniques such as hardware replication and software re-execution are ...
Jia Huang, Jan Olaf Blech, Andreas Raabe, Christia...
The importance of transient faults is predicted to grow due to current technology trends of increased scale of integration. One of the components that will be significantly affecte...
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...
Adrian Lifa, Petru Eles, Zebo Peng, Viacheslav Izo...
In the research reported in this paper, transient faults were injected in the nodes and in the communication subsystem (by using software fault injection) of a commercial parallel...
In this paper the consolidate identification of faults, distinguished as transient or permanent/intermittent, is approached. Transient faults discrimination has long been performe...
Andrea Bondavalli, Silvano Chiaradonna, Felicita D...
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...
The progression of implementation technologies into the sub-100 nanometer lithographies renew the importance of understanding and protecting against single-event upsets in digital...
Nicholas J. Wang, Justin Quek, Todd M. Rafacz, San...
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
A. J. KleinOsowski, Kevin KleinOsowski, Vijay Rang...