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37
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VLSID
2010
IEEE
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VLSI
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VLSID 2010
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A Combined DOE-ILP Based Power and Read Stability Optimization in Nano-CMOS SRAM
14 years 20 days ago
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www.cse.unt.edu
A novel design approach for simultaneous power and stability (static noise margin, SNM) optimization of nanoCMOS static random access memory (SRAM) is presented. A 45nm single-end...
Garima Thakral, Saraju P. Mohanty, Dhruva Ghai, Dh...
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