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26
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VLSID
2004
IEEE
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VLSI
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VLSID 2004
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Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests
14 years 12 months ago
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faculty.cs.tamu.edu
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. C...
Sagar S. Sabade, D. M. H. Walker
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