Sciweavers

VTS
1996
IEEE
76views Hardware» more  VTS 1996»
14 years 3 months ago
Test point insertion based on path tracing
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...
Nur A. Touba, Edward J. McCluskey
VTS
1996
IEEE
80views Hardware» more  VTS 1996»
14 years 3 months ago
Improving the accuracy of diagnostics provided by fault dictionaries
John W. Sheppard, William R. Simpson
VTS
1996
IEEE
111views Hardware» more  VTS 1996»
14 years 3 months ago
Synthesis-for-scan and scan chain ordering
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...
Robert B. Norwood, Edward J. McCluskey
VTS
1996
IEEE
112views Hardware» more  VTS 1996»
14 years 3 months ago
Optimal voltage testing for physically-based faults
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
Yuyun Liao, D. M. H. Walker
VTS
1996
IEEE
74views Hardware» more  VTS 1996»
14 years 3 months ago
An unexpected factor in testing for CMOS opens: the die surface
In this paper, we for the rst time present experimental evidence that the die surface can act as an RC interconnect, becoming an important factor in determining the voltage of a o...
Haluk Konuk, F. Joel Ferguson
VTS
1996
IEEE
126views Hardware» more  VTS 1996»
14 years 3 months ago
Automatic test generation using genetically-engineered distinguishing sequences
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
VTS
1996
IEEE
75views Hardware» more  VTS 1996»
14 years 3 months ago
A new test pattern generation method for delay fault testing
S. Cremoux, Christophe Fagot, Patrick Girard, Chri...
VTS
1996
IEEE
114views Hardware» more  VTS 1996»
14 years 3 months ago
Quantitative analysis of very-low-voltage testing
Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...
Jonathan T.-Y. Chang, Edward J. McCluskey