VTS
2006
IEEE
14 years 5 months ago
2006
IEEE
Abstract: An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU...
VTS
2006
IEEE
14 years 5 months ago
2006
IEEE
We consider self-testing of complete wireless nodes in the field through a low-energy software-based selftest (SBST) method. Energy consumption is optimized both for individual co...
VTS
2006
IEEE
14 years 5 months ago
2006
IEEE
Monte Carlo analysis has so far been the corner stone for analog statistical simulations. Fast and accurate simulations are necessary for stringent time-to-market, design for manu...
VTS
2006
IEEE
14 years 5 months ago
2006
IEEE
We tackle the problem of fault-free assumptions in current PLB and interconnect built-in-self-test (BIST) techniques for FPGAs. These assumptions were made in order to develop stro...
VTS
2006
IEEE
14 years 5 months ago
2006
IEEE
Abstract— Numerous machine-learning-based test methodologies have been proposed in recent years as a fast alternative to the standard functional testing of mixed-signal/RF integr...
VTS
2006
IEEE
14 years 5 months ago
2006
IEEE
A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measu...
VTS
2006
IEEE
2006
IEEE
Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based Rectangular Encoding
14 years 5 months ago
A technique is presented here for improving the compression achieved with any linear decompressor by adding a small non-linear decoder that exploits bit-wise and pattern-wise corr...
VTS
2006
IEEE
14 years 5 months ago
2006
IEEE
This paper presents the design and experimental results of fully integrated CMOS power sensors for RF built-in self-test (BIST) applications. Using a standard 0.18- m CMOS process...
VTS
2006
IEEE
14 years 5 months ago
2006
IEEE
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
VTS
2006
IEEE
14 years 5 months ago
2006
IEEE
This paper presents an improved method to accurately estimate signal probabilities using ordered partial decision diagrams (OPDDs) [Kodavarti 93] for partial representation of the...