ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
The objective of this paper is to present an infrastructure IP (I-IP) designed to characterize yield loss in the process back-end. The I-IP structure is described in using a botto...
CODES
2006
IEEE
14 years 5 months ago
2006
IEEE
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
VTS
2008
IEEE
14 years 5 months ago
2008
IEEE
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...