5 search results - page 1 / 1 » Analysis of the Feasibility of Dynamic Thermal Testing in Di... |
ATS
1997
IEEE
13 years 11 months ago
1997
IEEE
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
ICCAD
1997
IEEE
13 years 11 months ago
1997
IEEE
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
CCS
2006
ACM
13 years 11 months ago
2006
ACM
This paper presents EXE, an effective bug-finding tool that automatically generates inputs that crash real code. Instead of running code on manually or randomly constructed input,...