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    IEEE
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    Deterministic test generation for non-classical faults on the gate level

    14 years 3 months ago
    Deterministic test generation for non-classical faults on the gate level
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    Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck
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    Added 25 Aug 2010
    Updated 25 Aug 2010
    Type Conference
    Year 1995
    Where ATS
    Authors Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck
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