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24

DAC
2001
ACM

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112views Computer Architecture» more DAC 2001»

Test Volume and Application Time Reduction Through Scan Chain Concealment

15 years 12 days ago

Test Volume and Application Time Reduction Through Scan Chain Concealment

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Ismet Bayraktaroglu, Alex Orailoglu

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DAC 2001 | Design Automation | Scan Chain Concealment |

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Added	13 Nov 2009
Updated	13 Nov 2009
Type	Conference
Year	2001
Where	DAC
Authors	Ismet Bayraktaroglu, Alex Orailoglu

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