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TOSEM 2012
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Accounting for defect characteristics in evaluations of testing techniques
11 years 9 months ago
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Jaymie Strecker, Atif M. Memon
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Added
28 Sep 2012
Updated
28 Sep 2012
Type
Journal
Year
2012
Where
TOSEM
Authors
Jaymie Strecker, Atif M. Memon
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Researcher Info
TOSEM 2008 Study Group
Computer Vision