Multiple-detect test sets have been shown to be effective in lowering defect level. Other researchers have noted that observing the effects of a defect can be controlled by sensit...
R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Aniru...
We present a software defect prediction model using operating characteristic curves. The main idea behind our proposed technique is to use geometric insight in helping construct a...
This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and tes...
A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measu...
Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. ...