ASPDAC
2007
ACM
14 years 4 months ago
2007
ACM
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
DATE
2010
IEEE
14 years 5 months ago
2010
IEEE
—Associated with the ever growing integration scales is the increase in process variability. In the context of networkon-chip, this variability affects the maximum frequency that...
ICCAD
2006
IEEE
14 years 9 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
VLSID
2007
IEEE
15 years 25 days ago
2007
IEEE
Title of thesis: EFFICIENT AND ACCURATE STATISTICAL TIMING ANALYSIS FOR NON-LINEAR NON-GAUSSIAN VARIABILITY WITH INCREMENTAL ATTRIBUTES Ashish Dobhal, Master of Science, 2006 Thes...