Sciweavers

Free Online Productivity Tools i2Speak i2Symbol i2OCR iTex2Img iWeb2Print iWeb2Shot i2Type iPdf2Split iPdf2Merge i2Bopomofo i2Arabic i2Style i2Image i2PDF iLatex2Rtf Sci2ools

38

VTS
2008
IEEE

favoriteEmaildiscussreport

94views Hardware» more VTS 2008»

Scan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes

14 years 5 months ago

Scan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes

Download tiger.ee.nctu.edu.tw

Yu-Ze Wu, Mango Chia-Tso Chao

Real-time Traffic

VLSI | VTS 2008 |

claim paper

Related Content

» Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Const...

» A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limite...

» Low Power BIST Based on Scan Partitioning

Post Info
More Details (n/a)

Added	01 Jun 2010
Updated	01 Jun 2010
Type	Conference
Year	2008
Where	VTS
Authors	Yu-Ze Wu, Mango Chia-Tso Chao

Comments (0)