Increasing resistivity of copper with scaling and rising demands on current density requirements are driving the need to identify new wiring solutions for deep nanometer scale VLS...
In this paper, we present a method that helps improve the performance of Bounded Model Checking by automatically strengthening invariants so that the termination proof may be obta...
In this paper, we propose an exact algorithm for the problem of area optimization under a delay constraint in the synthesis of multiplierless FIR filters. To the best of our knowl...
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Traditionally, rectilinear Steiner minimum trees (RSMT) are widely used for routing estimation in design optimizations like floorplanning and physical synthesis. Since it optimize...
Charles J. Alpert, Andrew B. Kahng, Cliff C. N. Sz...
Modern integrated circuits require careful attention to the soft-error rate (SER) resulting from bit upsets, which are normally caused by alpha particle or neutron hits. These eve...
A rational Arnoldi method for passivity-preserving model-order reduction (MOR) with implicit multi-point moment matching for systems with frequency-dependent interconnects is desc...
Quming Zhou, Kartik Mohanram, Athanasios C. Antoul...
This paper presents an optimal procrastinating voltage scheduling (OP-DVS) for hard real-time systems using stochastic workload information. Algorithms are presented for both sing...
Yan Zhang, Zhijian Lu, John Lach, Kevin Skadron, M...
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
Andrey V. Zykov, Elias Mizan, Margarida F. Jacome,...
Recent study shows that the existing first order canonical timing model is not sufficient to represent the dependency of the gate delay on the variation sources when processing an...
Lizheng Zhang, Weijen Chen, Yuhen Hu, John A. Gubn...