Design and Analysis of a New Self-Testing Adder which Utilizes Polymorphic Gates

— This paper describes a new self-testing 1-bit full adder. This circuit consists of three polymorphic NAND/NOR gates, two XOR gates and two inverters. The adder is able to detect a reasonable number of stuck-at-faults without the need of any additional logic and diagnostic signals. A fault is indicated by oscillations at the carry-out output. Properties of n-bit carrypropagate adder which is composed of the proposed 1-bit selftesting adders are investigated.

• Type: Conference
• Year: 2007
• Where: DDECS
• Authors: Lukás Sekanina
• Keywords: DDECS 2007, Hardware, N-bit Carrypropagate Adder, Polymorphic Nand/nor, XOR Gates