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96

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ATS
1995
IEEE

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Deterministic test generation for non-classical faults on the gate level

15 years 6 months ago

Deterministic test generation for non-classical faults on the gate level

Download www.tet.uni-hannover.de

Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck

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Added	25 Aug 2010
Updated	25 Aug 2010
Type	Conference
Year	1995
Where	ATS
Authors	Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck

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