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ATS
1995
IEEE

Deterministic test generation for non-classical faults on the gate level

14 years 4 months ago
Deterministic test generation for non-classical faults on the gate level
Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck
Added 25 Aug 2010
Updated 25 Aug 2010
Type Conference
Year 1995
Where ATS
Authors Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck
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